Following a multi-year effort, the analysis centre has recently installed new imaging and automation electronics and software to improve ease of use and remote access.
The Concord University Materials and REE Analysis Center has completed a pioneering and pioneering upgrade of electronic microprobe hardware and software as part of a major modernization and enhanced equipment operations. This is based on the installation of high-performance GE diffraction crystals prior to 2024 improves X-ray spectral resolution and lower detection limits. And the lab hasn’t stopped here. Additionally planned enhancements are currently in the engineering and development phases.
Progress instrumentation
Concord University Materials and REE Analysis Center, in collaboration with SemTech Solutions and Advanced Microbeam Inc, is implementing a customized version of the SemView8000 system in the ARL SEMQ Electron Probe MicroAnalyser (EPMA). The March 2025 installation combines the latest electron microscope imaging, electronics and control software with the unique X-ray analysis properties of the ARL SEMQ design.
The instrument also features a new Bruker 730m Energy Dispersive (EDS) spectrometer, installing and utilizing the latest version of the latest version of the powerful probes of EPMA 14.x quantitative analysis software running on the Windows 11 PC platform and Bruker ESPRIT 2.6 software. This new “SEMQ 8000” instrument configuration uniquely offers seven total X-ray spectrometers (6 diffraction-based WDS types and one EDS types) combined with the latest automation for high-performance microanalytic applications.
Robust infrastructure for consistent performance
The support infrastructure provides clean power for stable environmental conditions, vibration isolation and consistent operation. Another sample preparation lab means that most of the material can be collected from raw samples in-house for analysis.
A collection of hundreds of minerals, glasses, metals and synthetic compounds supports instrument calibration and validation of quality control. The rich elements of many samples can periodically quantify relative accuracy above 1% in just a few minutes with a spatial resolution of a few micrometers.
The trace element detection limit of dozens of ppm is also readily obtained for most elements with further procedural optimization. These features are available to both internal and external users of education, government and industry.
This article will also be featured in the 22nd edition of Quarterly Publication.
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